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X-Ray Fluorescence Spectrometry (XRF)
The groundbreaking range of S4 EXPLORER and S4 PIONEER wavelength dispersive X-ray spectrometers, combine non-destructive, environmentally clean and safe multi element analysis with a market leading software package. Our new S2 RANGER energy dispersive system offers high performance with a compact design and competitive prices.
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X-Ray Diffraction (XRD)
The D8 and D4 range of instruments offer a non destructive method of analysing all kinds of matter from powders and thin films to components allowing for phase analysis, texture and stress measurements and thin film characterisation.
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Single Crystal Diffraction (X-Ray Crystallography)
The 'SMART' range of CCD Area Detector - based systems provides state-of-the-art solutions in Single-Crystal X-ray structure-determination and refinement - for both 'Chemical' and 'Biological' applications. SMART instruments may be used in conjunction with sealed-tube, rotating-anode and synchrotron sources.
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Microanalysis Systems
Innovative technology, ultimate reliability and simple operation are the outstanding features of our X-ray systems for microanalysis (EDX, μXRF), trace element analysis (TXRF) and structure analysis (EDXRD).
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